Encyclopedia of Materials Characterization - Surfaces, Interfaces, Thin Films
Brundle, C.Richard, Evans, Charles A. Jr., Wilson, Shaun(eds.)
This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series.
Categorie:
Anno:
1992
Casa editrice:
Elsevier
Lingua:
english
Pagine:
800
ISBN 10:
0750691689
ISBN 13:
9780750691680
File:
PDF, 20.33 MB
IPFS:
,
english, 1992